Quote:
È il nostro piacere aiutare mtb.
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Just perfect
Quote:
Never trust a disk that does something unusual.
Back it up.
Now.
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Tomorrow i'll buy a new one and i'll copy everything on it.
The problem is that i don't know what could have been. I even suspect the apt-get upgrade with libparted and parted...
Are smart logs interesting? ( nothing strange for me... But it isn't that "clear" )
Code:
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Maxtor DiamondMax 10 family
Device Model: Maxtor 6B160P0
Serial Number: B42J7GVH
Firmware Version: BAH41B70
User Capacity: 163,928,604,672 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Sun Mar 11 23:41:27 2007 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (1622) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 72) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
3 Spin_Up_Time 0x0027 206 206 063 Pre-fail Always - 18793
4 Start_Stop_Count 0x0032 252 252 000 Old_age Always - 2397
5 Reallocated_Sector_Ct 0x0033 253 253 063 Pre-fail Always - 0
6 Read_Channel_Margin 0x0001 253 253 100 Pre-fail Offline - 0
7 Seek_Error_Rate 0x000a 253 252 000 Old_age Always - 0
8 Seek_Time_Performance 0x0027 248 245 187 Pre-fail Always - 60233
9 Power_On_Minutes 0x0032 245 245 000 Old_age Always - 627h+02m
10 Spin_Retry_Count 0x002b 253 252 157 Pre-fail Always - 0
11 Calibration_Retry_Count 0x002b 253 252 223 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 247 247 000 Old_age Always - 2462
192 Power-Off_Retract_Count 0x0032 253 253 000 Old_age Always - 0
193 Load_Cycle_Count 0x0032 253 253 000 Old_age Always - 0
194 Temperature_Celsius 0x0032 041 253 000 Old_age Always - 48
195 Hardware_ECC_Recovered 0x000a 253 252 000 Old_age Always - 11517
196 Reallocated_Event_Count 0x0008 253 253 000 Old_age Offline - 0
197 Current_Pending_Sector 0x0008 253 253 000 Old_age Offline - 0
198 Offline_Uncorrectable 0x0008 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0008 199 199 000 Old_age Offline - 0
200 Multi_Zone_Error_Rate 0x000a 253 252 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 253 252 000 Old_age Always - 0
202 TA_Increase_Count 0x000a 253 252 000 Old_age Always - 0
203 Run_Out_Cancel 0x000b 253 252 180 Pre-fail Always - 0
204 Shock_Count_Write_Opern 0x000a 253 252 000 Old_age Always - 0
205 Shock_Rate_Write_Opern 0x000a 253 252 000 Old_age Always - 0
207 Spin_High_Current 0x002a 253 252 000 Old_age Always - 0
208 Spin_Buzz 0x002a 253 252 000 Old_age Always - 0
209 Offline_Seek_Performnce 0x0024 253 253 000 Old_age Offline - 0
210 Unknown_Attribute 0x0032 253 252 000 Old_age Always - 0
211 Unknown_Attribute 0x0032 253 252 000 Old_age Always - 0
212 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 1018 hours (42 days + 10 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 50 01 01 00 00 e0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 00 01 01 00 00 e0 00 00:39:03.367 NOP [Abort queued commands]
f0 00 18 6f 8c dc f0 00 00:38:43.244 [VENDOR SPECIFIC]
f0 00 08 67 8c dc f0 00 00:38:43.235 [VENDOR SPECIFIC]
f0 00 18 57 8e dc f0 00 00:38:43.232 [VENDOR SPECIFIC]
f0 00 18 3f 8e dc f0 00 00:38:43.231 [VENDOR SPECIFIC]
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.