rfernandez |
11-20-2010 04:46 PM |
I have udev-164-x86_64-3, but my system works just fine; no issues at all after the latest updates.
By the way, I have a Dell Inspiron N5010. My smartctl --all /dev/sda
Code:
# smartctl --all /dev/sda
smartctl 5.39.1 2010-01-28 r3054 [x86_64-slackware-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HM321HI
Serial Number: S2B4J56Z840422
Firmware Version: 2AJ10001
User Capacity: 320,072,933,376 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 6
Local Time is: Sat Nov 20 21:02:55 2010 BRST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (4800) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0
2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0
3 Spin_Up_Time 0x0023 094 093 025 Pre-fail Always - 2111
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 90
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 315
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 13
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 90
13 Read_Soft_Error_Rate 0x003a 100 100 000 Old_age Always - 0
191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 552
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
193 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 17025
194 Temperature_Celsius 0x0002 063 057 000 Old_age Always - 37 (Lifetime Min/Max 21/44)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 69
240 Head_Flying_Hours 0x0032 100 100 000 Old_age Always - 232
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 2544524
242 Total_LBAs_Read 0x0032 100 100 000 Old_age Always - 965636
254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 1
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 11 -
Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
shows quite a healthy disc, I guess.
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