| TB0ne |
04-02-2024 10:17 AM |
Quote:
Originally Posted by core.element.13
(Post 6493542)
I saw that my disk is likely to fail in the disk manager of linux mint today. After running 'sudo smartctl -a /dev/sdg > $HOME/smartctl-output.txt' this is what i see:
Code:
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.0-101-generic] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10
Device Model: ST3750640AS
Serial Number: 5QD100JB
Firmware Version: 3.AFK
User Capacity: 750,156,374,016 bytes [750 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 (minor revision not indicated)
Local Time is: Tue Apr 2 15:00:34 2024 KST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 202) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 118 081 006 Pre-fail Always - 191150989
3 Spin_Up_Time 0x0003 093 091 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 099 099 020 Old_age Always - 1968
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 1
7 Seek_Error_Rate 0x000f 032 032 030 Pre-fail Always - 101490119007107
9 Power_On_Hours 0x0032 098 098 000 Old_age Always - 2560
10 Spin_Retry_Count 0x0013 088 001 097 Pre-fail Always FAILING_NOW 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 320
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 057 040 045 Old_age Always In_the_past 43 (Min/Max 36/43)
194 Temperature_Celsius 0x0022 043 060 000 Old_age Always - 43 (0 15 0 0 0)
195 Hardware_ECC_Recovered 0x001a 069 048 000 Old_age Always - 31936972
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 217
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 177 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 177 occurred at disk power-on lifetime: 2292 hours (95 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 be d2 52 40 Error: ICRC, ABRT at LBA = 0x0052d2be = 5427902
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 b7 d2 52 40 00 01:40:47.469 READ DMA EXT
25 00 08 af d2 52 40 00 01:40:46.724 READ DMA EXT
25 00 08 a7 d2 52 40 00 01:40:46.678 READ DMA EXT
25 00 08 9f d2 52 40 00 01:40:46.676 READ DMA EXT
25 00 08 97 d2 52 40 00 01:40:47.825 READ DMA EXT
Error 176 occurred at disk power-on lifetime: 2292 hours (95 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 2f 98 35 04 40 Error: ICRC, ABRT 47 sectors at LBA = 0x00043598 = 275864
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 40 87 35 04 40 00 01:38:07.132 READ DMA EXT
25 00 40 47 35 04 40 00 01:38:07.130 READ DMA EXT
25 00 40 07 35 04 40 00 01:38:07.128 READ DMA EXT
25 00 40 c7 34 04 40 00 01:38:07.126 READ DMA EXT
25 00 40 87 34 04 40 00 01:38:07.124 READ DMA EXT
Error 175 occurred at disk power-on lifetime: 2292 hours (95 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 2f 58 b5 00 40 Error: ICRC, ABRT 47 sectors at LBA = 0x0000b558 = 46424
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 40 47 b5 00 40 00 01:35:01.053 READ DMA EXT
25 00 08 07 88 6f 40 00 01:35:01.029 READ DMA EXT
25 00 40 07 b5 00 40 00 01:35:01.007 READ DMA EXT
25 00 08 e7 4b 20 40 00 01:35:01.005 READ DMA EXT
25 00 40 c7 b4 00 40 00 01:35:00.994 READ DMA EXT
Error 174 occurred at disk power-on lifetime: 2292 hours (95 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 76 68 85 40 Error: ICRC, ABRT at LBA = 0x00856876 = 8743030
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 6f 68 85 40 00 01:30:52.833 READ DMA EXT
25 00 08 07 97 82 40 00 01:30:52.832 READ DMA EXT
25 00 08 4f 8c 82 40 00 01:30:52.832 READ DMA EXT
25 00 01 4f f3 af 40 00 01:30:52.840 READ DMA EXT
25 00 08 4f f3 af 40 00 01:30:52.840 READ DMA EXT
Error 173 occurred at disk power-on lifetime: 2289 hours (95 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 a7 18 61 73 40 Error: ICRC, ABRT 167 sectors at LBA = 0x00736118 = 7561496
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 f8 c7 60 73 40 00 07:54:22.657 READ DMA EXT
25 00 08 47 7a 73 40 00 07:54:22.655 READ DMA EXT
25 00 08 bf 60 73 40 00 07:54:22.643 READ DMA EXT
25 00 01 4f f3 af 40 00 07:54:22.635 READ DMA EXT
25 00 08 3f e7 95 40 00 07:54:22.620 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 2529 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
should i give up all hope? or can i save it?
|
You should back up your data immediately (as you should be all the time), and replace the disk. There's no saving it...disks die, period. This is on the way out and your single option is replacement. Better do it while you can and still have time to schedule things, rather than having to do it at 2 AM over a weekend. |
