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Old 04-02-2005, 11:07 AM   #1
martinius
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Registered: Apr 2005
Distribution: RHFC3
Posts: 12

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hd problem generated by smartd


My smartd has generated an error report and I can't figure out what it exactly means. If someone could analyze it I have included the report. And of course, thanks in advance

==========================================================
[root@martinius ~]# smartctl -a /dev/hda
smartctl version 5.33 [i386-redhat-linux-gnu] Copyright (C) 2002-4 Bruce Allen
Home page is ...(removed)

=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MP0804H
Serial Number: S042J10X813340
Firmware Version: UE100-11
User Capacity: 80,060,424,192 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Sat Apr 2 17:04:21 2005 CEST

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (4800) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 079 077 011 Pre-fail Always - 4032
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 741
5 Reallocated_Sector_Ct 0x0033 097 097 011 Pre-fail Always - 8
7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 100 100 011 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 281731
10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 367
191 G-Sense_Error_Rate 0x0012 097 097 000 Old_age Always - 39528
194 Temperature_Celsius 0x0022 097 079 000 Old_age Always - 47
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 7486939
196 Reallocated_Event_Count 0x0032 096 096 000 Old_age Always - 9
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 098 098 000 Old_age Offline - 6
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age Always - 0
201 Soft_Read_Error_Rate 0x0012 100 100 000 Old_age Always - 0
223 Load_Retry_Count 0x0012 100 100 000 Old_age Always - 539
225 Load_Cycle_Count 0x0012 080 080 000 Old_age Always - 208821
255 Unknown_Attribute 0x000a 100 100 051 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 682 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 682 occurred at disk power-on lifetime: 1259 hours (52 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 10 ef 92 03 e4 Error: UNC 16 sectors at LBA = 0x040392ef = 67343087

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 10 ef 92 03 e4 00 01:09:51.938 READ DMA
c8 00 40 a9 43 9f e3 00 01:09:51.938 READ DMA
c8 00 08 57 f0 98 e3 00 01:09:51.875 READ DMA
c8 00 80 cf 0c 34 e3 00 01:09:51.875 READ DMA
c8 00 08 67 5d 0d e2 00 01:09:51.875 READ DMA

Error 681 occurred at disk power-on lifetime: 1259 hours (52 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 ef 92 03 e4 Error: UNC 8 sectors at LBA = 0x040392ef = 67343087

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 ef 92 03 e4 00 01:09:50.438 READ DMA
c8 00 20 99 42 9f e3 00 01:09:50.438 READ DMA
c8 00 08 57 05 99 e3 00 01:09:50.438 READ DMA
c8 00 80 4f 0c 34 e3 00 01:09:50.438 READ DMA
ca 00 08 2f 1f 0d e2 00 01:09:50.438 WRITE DMA

Error 680 occurred at disk power-on lifetime: 1259 hours (52 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 28 f7 92 03 e4 Error: UNC 40 sectors at LBA = 0x040392f7 = 67343095

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 28 f7 92 03 e4 00 01:09:49.000 READ DMA

Error 679 occurred at disk power-on lifetime: 1259 hours (52 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 ef 92 03 e4 Error: UNC 8 sectors at LBA = 0x040392ef = 67343087

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 ef 92 03 e4 00 01:09:47.750 READ DMA
ca 00 01 57 66 a8 e3 00 01:09:47.750 WRITE DMA
c8 00 38 f9 42 9f e3 00 01:09:47.688 READ DMA
c8 00 08 67 ef 98 e3 00 01:09:47.688 READ DMA
c8 00 80 cf 0b 34 e3 00 01:09:47.688 READ DMA

Error 678 occurred at disk power-on lifetime: 1259 hours (52 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 30 ef 92 03 e4 Error: UNC 48 sectors at LBA = 0x040392ef = 67343087

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 30 ef 92 03 e4 00 01:09:46.375 READ DMA
c8 00 08 e7 92 03 e4 00 01:09:46.375 READ DMA
c8 00 10 49 42 9f e3 00 01:09:46.313 READ DMA
c8 00 08 cf ef 98 e3 00 01:09:46.313 READ DMA
c8 00 80 4f 0b 34 e3 00 01:09:46.313 READ DMA

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]


Device does not support Selective Self Tests/Logging
==========================================================
 
Old 04-03-2005, 10:23 PM   #2
Grommet
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Registered: Feb 2005
Location: OZ
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smartd looks like its doing what it's meant to matey....

the samsung Smart system has a slightly different setup to say a quantum/maxtor/conner version so i would say you need to tell smart to use samsung or samsung/2 as the optionon this disk to get some of the other functions to work......

look at

-F TYPE, --firmwarebug=TYPE
Modifies the behavior of smartctl to compensate for some known
and understood device firmware bug. The valid arguments to this
option are:

none Assume that the device firmware obeys the ATA specifica-
tions. This is the default.

samsung In some Samsung disks (example: model SV4012H Firmware
Version: RM100-08) some of the two- and four-byte quantities in
the SMART data structures are byte-swapped (relative to the ATA
specification). Enabling this option tells smartctl to evaluate
these quantities in byte-reversed order. Some signs that your
disk needs this option are (1) no self-test log printed, even
though you have run self-tests; (2) very large numbers of ATA
errors reported in the ATA error log; (3) strange and impossible
values for the ATA error log timestamps.

samsung2 In more recent Samsung disks (firmware revisions ending
in "-23") the number of ATA errors reported is byte swapped.
Enabling this option tells smartctl to evaluate this quantity in
byte-reversed order.

[Please see the smartctl -F command-line option.]


this is the page i looked at http://gd.tuwien.ac.at/linuxcommand....s/smartd8.html after googleing for smartd samsung
 
Old 04-04-2005, 05:57 AM   #3
martinius
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Registered: Apr 2005
Distribution: RHFC3
Posts: 12

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Thanks. I tried all thinkable options but guess something must have slipped. Let's now see if it continues to generate errors ...
 
  


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