hd problem generated by smartd
My smartd has generated an error report and I can't figure out what it exactly means. If someone could analyze it I have included the report. And of course, thanks in advance :)
========================================================== [root@martinius ~]# smartctl -a /dev/hda smartctl version 5.33 [i386-redhat-linux-gnu] Copyright (C) 2002-4 Bruce Allen Home page is ...(removed) === START OF INFORMATION SECTION === Device Model: SAMSUNG MP0804H Serial Number: S042J10X813340 Firmware Version: UE100-11 User Capacity: 80,060,424,192 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Sat Apr 2 17:04:21 2005 CEST ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (4800) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 80) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 079 077 011 Pre-fail Always - 4032 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 741 5 Reallocated_Sector_Ct 0x0033 097 097 011 Pre-fail Always - 8 7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 100 100 011 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 281731 10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 367 191 G-Sense_Error_Rate 0x0012 097 097 000 Old_age Always - 39528 194 Temperature_Celsius 0x0022 097 079 000 Old_age Always - 47 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 7486939 196 Reallocated_Event_Count 0x0032 096 096 000 Old_age Always - 9 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 098 098 000 Old_age Offline - 6 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age Always - 0 201 Soft_Read_Error_Rate 0x0012 100 100 000 Old_age Always - 0 223 Load_Retry_Count 0x0012 100 100 000 Old_age Always - 539 225 Load_Cycle_Count 0x0012 080 080 000 Old_age Always - 208821 255 Unknown_Attribute 0x000a 100 100 051 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 682 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 682 occurred at disk power-on lifetime: 1259 hours (52 days + 11 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 10 ef 92 03 e4 Error: UNC 16 sectors at LBA = 0x040392ef = 67343087 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 10 ef 92 03 e4 00 01:09:51.938 READ DMA c8 00 40 a9 43 9f e3 00 01:09:51.938 READ DMA c8 00 08 57 f0 98 e3 00 01:09:51.875 READ DMA c8 00 80 cf 0c 34 e3 00 01:09:51.875 READ DMA c8 00 08 67 5d 0d e2 00 01:09:51.875 READ DMA Error 681 occurred at disk power-on lifetime: 1259 hours (52 days + 11 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 ef 92 03 e4 Error: UNC 8 sectors at LBA = 0x040392ef = 67343087 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 ef 92 03 e4 00 01:09:50.438 READ DMA c8 00 20 99 42 9f e3 00 01:09:50.438 READ DMA c8 00 08 57 05 99 e3 00 01:09:50.438 READ DMA c8 00 80 4f 0c 34 e3 00 01:09:50.438 READ DMA ca 00 08 2f 1f 0d e2 00 01:09:50.438 WRITE DMA Error 680 occurred at disk power-on lifetime: 1259 hours (52 days + 11 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 28 f7 92 03 e4 Error: UNC 40 sectors at LBA = 0x040392f7 = 67343095 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 28 f7 92 03 e4 00 01:09:49.000 READ DMA Error 679 occurred at disk power-on lifetime: 1259 hours (52 days + 11 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 ef 92 03 e4 Error: UNC 8 sectors at LBA = 0x040392ef = 67343087 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 ef 92 03 e4 00 01:09:47.750 READ DMA ca 00 01 57 66 a8 e3 00 01:09:47.750 WRITE DMA c8 00 38 f9 42 9f e3 00 01:09:47.688 READ DMA c8 00 08 67 ef 98 e3 00 01:09:47.688 READ DMA c8 00 80 cf 0b 34 e3 00 01:09:47.688 READ DMA Error 678 occurred at disk power-on lifetime: 1259 hours (52 days + 11 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 30 ef 92 03 e4 Error: UNC 48 sectors at LBA = 0x040392ef = 67343087 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 30 ef 92 03 e4 00 01:09:46.375 READ DMA c8 00 08 e7 92 03 e4 00 01:09:46.375 READ DMA c8 00 10 49 42 9f e3 00 01:09:46.313 READ DMA c8 00 08 cf ef 98 e3 00 01:09:46.313 READ DMA c8 00 80 4f 0b 34 e3 00 01:09:46.313 READ DMA SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Device does not support Selective Self Tests/Logging ========================================================== |
smartd looks like its doing what it's meant to matey....
the samsung Smart system has a slightly different setup to say a quantum/maxtor/conner version so i would say you need to tell smart to use samsung or samsung/2 as the optionon this disk to get some of the other functions to work...... look at -F TYPE, --firmwarebug=TYPE Modifies the behavior of smartctl to compensate for some known and understood device firmware bug. The valid arguments to this option are: none Assume that the device firmware obeys the ATA specifica- tions. This is the default. samsung In some Samsung disks (example: model SV4012H Firmware Version: RM100-08) some of the two- and four-byte quantities in the SMART data structures are byte-swapped (relative to the ATA specification). Enabling this option tells smartctl to evaluate these quantities in byte-reversed order. Some signs that your disk needs this option are (1) no self-test log printed, even though you have run self-tests; (2) very large numbers of ATA errors reported in the ATA error log; (3) strange and impossible values for the ATA error log timestamps. samsung2 In more recent Samsung disks (firmware revisions ending in "-23") the number of ATA errors reported is byte swapped. Enabling this option tells smartctl to evaluate this quantity in byte-reversed order. [Please see the smartctl -F command-line option.] this is the page i looked at http://gd.tuwien.ac.at/linuxcommand....s/smartd8.html after googleing for smartd samsung |
Thanks. I tried all thinkable options but guess something must have slipped. Let's now see if it continues to generate errors ...
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