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paind 06-30-2007 06:44 AM
hard drive loading problem
 
Archlinux boots very slow. Here is some information on boot process:

Code:
libata version 2.20 loaded.
pata_amd 0000:00:06.0: version 0.2.8
PCI: Setting latency timer of device 0000:00:06.0 to 64
ata1: PATA max UDMA/133 cmd 0x000101f0 ctl 0x000103f6 bmdma 0x0001e000 irq 14
ata2: PATA max UDMA/133 cmd 0x00010170 ctl 0x00010376 bmdma 0x0001e008 irq 15
scsi0 : pata_amd <-system hangs here for about 15-20 seconds
ata1.00: ATA-7: SAMSUNG SP2514N, VF100-33, max UDMA/100
ata1.00: 488397168 sectors, multi 16: LBA48
ata1.00: Drive reports diagnostics failure. This may indicate a drive  <-then i notice this
ata1.00: fault or invalid emulation. Contact drive vendor for information.
ata1.00: configured for UDMA/100
scsi1 : pata_amd -> everything is far more quick here
Is there something wrong with my hard SAMSUNG SP2514N? Or i can do something to speed up the process.

btw samsung hard drive is 250G. And when I formated one logical partition on it(qtparted) to ext3, I noticed that 11Gigs of space were marked as occupied on this partition.
Also I didn't get this error on slackware.

macemoneta 07-01-2007 03:52 PM
Run 'smartctl -a' on the drive to get details.

paind 07-02-2007 03:20 AM
Thanks for advice.
Code:
=== START OF INFORMATION SECTION ===
Model Family:    SAMSUNG SpinPoint P120 series
Device Model:    SAMSUNG SP2514N
Serial Number:    S08BJ10YB02460
Firmware Version: VF100-33
User Capacity:    250 059 350 016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:  7
ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 4a
Local Time is:    Mon Jul  2 12:26:11 2007 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82) Offline data collection activity
                                        was completed without error.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status:      (  0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                (4806) seconds.
Offline data collection
capabilities:                    (0x5b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (  1) minutes.
Extended self-test routine
recommended polling time:        (  80) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG    VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate    0x000f  253  100  051    Pre-fail  Always      -      0
  3 Spin_Up_Time            0x0007  100  100  025    Pre-fail  Always      -      5824
  4 Start_Stop_Count        0x0032  098  098  000    Old_age  Always      -      2432
  5 Reallocated_Sector_Ct  0x0033  253  253  010    Pre-fail  Always      -      0
  7 Seek_Error_Rate        0x000f  253  253  051    Pre-fail  Always      -      0
  8 Seek_Time_Performance  0x0025  253  253  015    Pre-fail  Offline      -      0
  9 Power_On_Hours          0x0032  100  100  000    Old_age  Always      -      3901
 10 Spin_Retry_Count        0x0033  253  253  051    Pre-fail  Always      -      0
 11 Calibration_Retry_Count 0x0012  253  002  000    Old_age  Always      -      0
 12 Power_Cycle_Count      0x0032  099  099  000    Old_age  Always      -      1264
190 Temperature_Celsius    0x0022  118  103  000    Old_age  Always      -      40
194 Temperature_Celsius    0x0022  118  103  000    Old_age  Always      -      40
195 Hardware_ECC_Recovered  0x001a  100  100  000    Old_age  Always      -      15418
196 Reallocated_Event_Count 0x0032  253  253  000    Old_age  Always      -      0
197 Current_Pending_Sector  0x0012  253  253  000    Old_age  Always      -      0
198 Offline_Uncorrectable  0x0030  253  253  000    Old_age  Offline      -      0
199 UDMA_CRC_Error_Count    0x003e  200  200  000    Old_age  Always      -      0
200 Multi_Zone_Error_Rate  0x000a  253  100  000    Old_age  Always      -      0
201 Soft_Read_Error_Rate    0x000a  253  100  000    Old_age  Always      -      0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline      Completed without error      00%      3898        -

SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Now running long test to see if anything will change.

paind 07-02-2007 04:53 AM
Seems like everything is fine:
Code:
=== START OF READ SMART DATA SECTION ===
SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error      00%      3901        -
# 2  Short offline      Completed without error      00%      3898        -

macemoneta 07-02-2007 07:41 AM
Yes, your drive is fine. The error at boot appears bogus. If your maintenance (in particular the kernel) is up to date, you might consider filing a bug report with your distribution.

paind 07-02-2007 08:39 AM
Ok, thanks for help.
I will file bug report and see what happens next.

paind 07-19-2007 01:21 AM
I solved the problem by replacing ATA connector with the new one.Old one isn't looking good(i.e. slightly cut wires etc).


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